Computer simulation of reflectance due to dielectric mirror

Abstract

The present work is calculating the reflectance due to stacked multilayer dielectric material. The
calculation is based on the analysis of the characteristic matrix of an arrangement of n layers, each
containing parameters that dealing with reflection (reflective index, optical thickness, wavelength
of incident wave, angle of incident wave). The implication of this calculation on a dielectric mirror
is pointed out. For certain arrangement of dielectric layers with a particular thickness, maximum
reflectance can be obtained. In this work, FORTRAN program has been written to obtain the product of matrices. Calculation of reflectance and transmittance which are particularly needed in this
context have been obtained.